Understanding Semiconductors | Episode 8

Understanding Semiconductors

Modern metrology from Lab to Fab by Rigaku.

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In this episode, SUMAN DATTA on What is the Next Big Thing In The Semiconductor Industry? (Part 1)

KEY TOPICS

Suman’s Career Journey
Today’s Talent Pipeline in the Semiconductor Industry
How to attract the best and brightest into electrical engineering?
What is the Next Big Thing in the Semiconductor Industry?
The Increasing Importance of Chip Security, Advanced Bonding Techniques and Packaging Solutions creating more complex and groundbreaking chips

In this episode of Understanding Semiconductors, Markus speaks with Suman Datta, the Joseph M Pettit Chair of Advanced Computing and Georgia Research Alliance (GRA), an Eminent Scholar and Professor in the School of Electrical & Computer Engineering at Georgia Tech. His research group focuses on semiconductor devices that enable new computing models such as in-memory computing, brain-inspired computing, cryogenic computing, resilient computing, etc. "

Reach out to Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

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Markus Kuhn

Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology.