GET A QUOTE - XTRAIA MF-2000

    Image - XTRAIA MF-2000

     

    GET A QUOTE - XTRAIA MF-2000

     

    FEATURES & BENEFITS

    • Micro-spot X-ray beams and pattern recognition
    • High-throughput, product-wafer measurements
    • Wide range of materials and applications
    • High resolution and precision covering thicknesses from Ångstroms to microns
    • For 200 mm (and smaller) wafers with open cassette and SMIF load port configurations
    • Available with SECS/GEM communication
    • Design based on SEMI S2 and SEMI S8
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