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Understanding Semiconductors | Episode 7

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Understanding Semiconductors

Modern metrology from Lab to Fab by Rigaku.

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In this episode, Dr. Yihung Lin on Machine Learning, Big Data, and Open Platforms: the Future of Metrology

KEY TOPICS

  • The Future of Metrology  
  • Machine Learning + Big Data  
  • How does an analytical services company value semiconductor research and manufacturing? 

In this episode of Understanding Semiconductors, Markus speaks with Dr. Yihing, Vice President of the Analytical Service Group within Covalent Metrology. Covalent Metrology is a leading supplier of cutting-edge analytical services and enterprise metrology solutions for diverse companies doing advanced material innovations. 

They discuss:

  • Dr. Lin’s Career Journey - Intel, TSMC, etc. 
  • Where Dr. Lin believes Metrology is heading and blending that into what role metrology currently plays in semiconductor development and manufacturing  
  • How does big data play into the standards in the Semiconductor Industry? 
  • The current and future of Metrology  

 

Reach out to Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

To ensure you never miss an episode of the Understanding Semiconductor podcast, subscribe to Apple Podcasts, Spotify, Google, or our website. Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.