Understanding Semiconductors | Episode 1
Understanding Semiconductors
Modern metrology from Lab to Fab by Rigaku.
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode:
Markus talks about
- How he became involved in Semiconductor Technology Development
- His motivations behind launching this podcast
- Why the topic of Metrology is essential for the Semiconductor Industry
- How is Metrology currently being utilized in the Semiconductor Industry, and how it can be improved
- Is the future of Metrology revolutionary or evolutionary?
Reach out to Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology.