2023 Semiconductor Forum Content Hub

The World of Semiconductors Metrology Tools, from Lab to Fab

We thank everyone who attended our inaugural Rigaku Semiconductor Forum 2023. Our distinguished speakers provided valuable insights and perspectives, making the discussion informative and engaging. We thank all the participants who contributed to the success of our event. We appreciate your participation in collectively driving progress in this critical field of study. We commend you for your support and active engagement throughout the forum; your expertise and dedication to advancing knowledge in the field of semiconductors have significantly contributed to the growth and vitality of our community.

Rigaku Europe SE and Rigaku Semiconductor Metrology Division brought this event to you.

THE SESSIONS

DAY ONE - SESSION 1

Europe Semiconductor Ecosystem in

a $1T Era by 2030

Dr. Laith Altimime - President of SEMI Europe

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DAY ONE - SESSION 2

Metrology and Expectations

of tomorrow's IC Industry

Dr. Paul Van Der Heide - IMEC

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DAY ONE - SESSION 3

Controlling Properties of

Wide Bandgap Materials in Industry

Dr. Andrea Severino - ST Catania R&D ST Microelectronics

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DAY ONE - SESSION 4

Third-generation photovoltaics

based on perovskites

Dr. Alessandra Alberti - National Research Council of Italy

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DAY ONE - SESSION 5

An Introduction to Nanovation and how we use XRD for

Characterization and Quality Control

of Oxide Semiconductors

Dr. David Rogers - Nanovation

DAY TWO - SESSION 1

European Semi Outlook

Challenges and Opportunities

Boris Metodiev -TechInsights

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DAY TWO - SESSION 2

Integrated photonics

with Pockels materials

Dr. Jean Fompeyrine - Lumiphase

DAY TWO - SESSION 3

X-ray Metrology Opportunities and Challenges

for Advanced Semiconductor Technologies

Dr. Kyioshi Ogata - Rigaku Corporation

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DAY TWO - SESSION 4

Metrology

from Lab to Fab

Dr. Abner Bello - Corning Incorporated

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DAY TWO - SESSION 5

Crystallographic defect characterization of semiconductor

single crystalline materials by X-ray topography

Dr. Ing. Christian Reimann - Fraunhofer

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IF YOU NEED MORE INFORMATION, CONTACT US AT:

RIGAKU EUROPE SE

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Neu-Isenburg

63263 , Germany

semieurope@rigaku.com

+49 6102 77999 51

RIGAKU AMERICAS CORPORATION

9009 New Trails Drive

The Woodlands, TX

77381-5209, USA

rsmd@rigaku.com

+1-281-362-2300

RIGAKU CORPORATION

3-9-12, Matsubara-cho

Akishima-shi, Tokyo

196-8666, Japan

info-gsm@rigaku.co.jp

+81 3-3479-0618

Markus Kuhn

Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology.