Understanding Semiconductors
Modern metrology from Lab to Fab by Rigaku.
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode, IS THERE A DISTINCTION BETWEEN LAB AND FAB IN EARLY INCARNATION OF METROLOGY? HOW TO APPROACH THE FUTURE METROLOGY CHALLENGES?
Markus speaks with Professor Alain Diebold, Ph.D. | Viewpoints to a Modern and Efficient Approach to Metrology Challenges and Key Takeaways from 2022 Frontiers of Characterization and Metrology for Nanoelectronics Conference.
- Was there a distinction between lab and fab in early incarnations of Metrology?
- Success Stories out of Alain’s Relationship with SEMATECH
- How to Address the “Valley of Death” between a well-nurtured academic idea and an actual product?
- What is an effective way to approach future metrology challenges?
- The Purpose and “why” behind the 2022 Frontiers of Characterization and Metrology for Nanoelectronics Conference (FCMN)
Reach out to Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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