RSMD News and Use Cases

2023 Semiconductor Forum Content Hub

Written by Markus Kuhn | Jul 11, 2023 11:00:00 AM

The World of Semiconductors Metrology Tools, from Lab to Fab

We thank everyone who attended our inaugural Rigaku Semiconductor Forum 2023. Our distinguished speakers provided valuable insights and perspectives, making the discussion informative and engaging. We thank all the participants who contributed to the success of our event.  We appreciate your participation in collectively driving progress in this critical field of study. We commend you for your support and active engagement throughout the forum; your expertise and dedication to advancing knowledge in the field of semiconductors have significantly contributed to the growth and vitality of our community.

Rigaku Europe SE and Rigaku Semiconductor Metrology Division brought this event to you.

THE SESSIONS

DAY ONE - SESSION 1


Europe Semiconductor Ecosystem in

a $1T Era by 2030

Dr. Laith Altimime - President of SEMI Europe

 VIEW PRESENTATION

DAY ONE - SESSION 2


Metrology and Expectations

of tomorrow's IC Industry

Dr. Paul Van Der Heide - IMEC

 VIEW PRESENTATION

DAY ONE - SESSION 3

Controlling Properties of

Wide Bandgap Materials in Industry

Dr. Andrea Severino -  ST Catania R&D ST Microelectronics

 VIEW PRESENTATION

DAY ONE - SESSION 4

Third-generation photovoltaics

based on perovskites

Dr. Alessandra Alberti - National Research Council of Italy

 VIEW PRESENTATION

DAY ONE - SESSION 5


An Introduction to
Nanovation and how we use XRD for

Characterization and Quality Control

of Oxide Semiconductors

Dr. David Rogers - Nanovation

 

DAY TWO - SESSION 1


European Semi Outlook

Challenges and Opportunities

 

Boris Metodiev -TechInsights

VIEW PRESENTATION

DAY TWO - SESSION 2


Integrated photonics

with Pockels materials

Dr. Jean Fompeyrine - Lumiphase

 

DAY TWO - SESSION 3


X-ray Metrology Opportunities and Challenges

for Advanced Semiconductor Technologies

Dr. Kyioshi Ogata - Rigaku Corporation

Request information

DAY TWO - SESSION 4

Metrology

from Lab to Fab

Dr. Abner Bello - Corning Incorporated

VIEW PRESENTATION

DAY TWO - SESSION 5

Crystallographic defect characterization of semiconductor

single crystalline materials by X-ray topography

Dr. Ing. Christian Reimann - Fraunhofer

 VIEW PRESENTATION

 

IF YOU NEED MORE INFORMATION, CONTACT US AT:

 

RIGAKU EUROPE SE

Hugenottenallee 167

Neu-Isenburg

63263 , Germany

semieurope@rigaku.com

+49 6102 77999 51

RIGAKU AMERICAS CORPORATION

9009 New Trails Drive

The Woodlands, TX

77381-5209, USA

rsmd@rigaku.com

+1-281-362-2300

RIGAKU CORPORATION

3-9-12, Matsubara-cho

Akishima-shi, Tokyo

196-8666, Japan

info-gsm@rigaku.co.jp

+81 3-3479-0618