Understanding Semiconductors | Episode 5

Understanding Semiconductors

Modern metrology from Lab to Fab by Rigaku.

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In this episode, increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NIST.

Markus speaks with J. Alexander Liddle, Scientific Director at NIST. The conversation is primarily focused on Increased Metrology Means Increased Data. So what Do We Do With It?

The National Institute of Standards and Technology (NIST) is a physical sciences laboratory and non-regulatory agency of the United States Department of Commerce. NIST's activities are organized into laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement. 

They discuss:

•  Alex’s Career Journey to NIST
•  Dimensional Metrology
•  The Measurement of a Test Structure vs. the Actual Structure and Coverage
•  The trend to measure everything you can across the wafer
• Key Trends Alex noticed at this years Frontiers conference  
• Stochastic Failures, Lithography and Reliability
  
  

Reach out to Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

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