TECHNIQUES AND TOOLS
A podcast designed to connect Semiconductor Industry experts to explore their viewpoints about Modern Metrology from Lab to Fab for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
wafer inspection and metrology techniques
Learn about the most reliable solutions to your metrology challenges:
WD-XRF: Wavelength Dispersive X-ray Fluorescence
TXRF: Total Reflection X-ray Fluorescence
XRR : X-ray Reflectometry
ED-XRF : Energy Dispersive X-Ray Fluorescence
CD-SAXS : Critical-Dimension Small-Angle X-ray Scattering
HR-XRD : High-Resolution X-Ray Diffraction
XRF : X-ray Fluorescence
XRD : X-ray Diffraction