CONSULT AN EXPERT - XTRAIA MF-2000

PROCESS XRR, XRF, AND XRD METROLOGY FAB TOOL

The Rigaku XTRAIA MF-2000 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.